THORS STUDENT PACKAGES: SEMICONDUCTOR SERIES

Semiconductor Metrology

Semiconductor Module 3 Courses:

Semiconductor Metrology introduces the essential principles and tools of semiconductor metrology and inspection. The two courses in this module are designed to build a deeper knowledge and practical understanding of how measurements and inspections are used to control and optimize semiconductor manufacturing processes.

NOTE: This module requires successful completion of module 2: Semiconductor Manufacturing

You will gain the knowledge needed to:

Understand the purpose of semiconductor metrology and inspection
Describe defect inspection, characterization, and review processes
Identify key parameters measured to control fabrication processes
Recognize the role of wafer inspection and process control instruments
Explain how measurement and inspection support yield, quality, and reliability

Module 3 Price:
₹9,000 ₹2,250
^{Package discount (75% off)}

This module includes:

Course Details:

Explore how defect inspection, defect characterization, and defect review are used to identify, classify, and analyze defects that can impact yield and device performance. This module also covers the key parameters measured across different process steps to ensure consistency, quality, and control throughout fabrication. In addition, learners will gain insight into the wide range of metrology and inspection instruments, from wafer inspection systems to advanced process control metrology tools used in modern fabs.

Semiconductor Metrology Basics

Course Description

This course introduces the learners to the significance of testing in semiconductor manufacturing. This course focuses on key measurements in semiconductor metrology for defect inspection and process control. Presented in THORS’ highly visual and interactive learning format, this course will equip the learner with a foundational knowledge of semiconductor metrology.

Learning Objectives

Recognize the significance of metrology in semiconductor manufacturing.
Identify the types and causes of defects.
Classify defects based on the pattern of their occurrence on a wafer.
Recognize the methods used for defect review.
Explain the key parameters required to characterize and control semiconductor manufacturing processe

Who will benefit from this semiconductor electronics course?

Quality, manufacturing, engineering, design, testing, purchasing, and sales functions at organizations that require a comprehensive understanding of the processes involved in semiconductor metrology from defect inspection to semiconductor manufacturing process metrology.

Learning Hours: 1.5

Semiconductor Metrology Instruments

Course Description

The THORS Semiconductor Metrology Instruments course introduces the learners to the various instruments used in semiconductor testing. This course focuses on wafer inspection systems, which are used for identifying defects, and process control metrology instruments, which are used for measuring various aspects of semiconductor manufacturing processes. Presented in THORS’ highly visual and interactive learning format, this course will equip the learner with a foundational knowledge of semiconductor metrology.

Learning Objectives

Identify the different wafer inspection systems and their optical and charged particle sources.
Recognize some of the commonly used instruments in destructive techniques and their applications.
Recognize some of the commonly used instruments in nondestructive techniques and their applications.
Describe the instruments and techniques used in process control metrology for the different deposited films and intricate pattern designs.
Explain the measurement techniques used for topography and physical dimension measurement.
Distinguish between the various techniques for analyzing material composition.
Understand the instruments used in material property measurements.

Who will benefit from this semiconductor electronics course?

Quality, manufacturing, engineering, design, testing, purchasing, and sales functions at organizations that require a comprehensive understanding of the instruments and techniques involved in semiconductor metrology from wafer inspection systems to process control metrology.

Learning Hours: 2

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